Saturated vs. Unsaturated HAST Chambers: Standards & Applications
Highly Accelerated Stress Test (HAST) chambers are essential tools for fast-tracking reliability validation in electronics, automotive, aerospace, and materials industries. These chambers simulate high-temperature and high-humidity conditions under pressure to reveal moisture-induced failure modes faster than traditional tests.
Types of HAST Chambers
Saturated HAST Chamber
Operates at ~121 °C and 100% RH under 0.2–0.4 MPa pressure. Ideal for sealed or plastic-packaged electronic components.Unsaturated HAST Chamber
Operates at higher temperature (110–130 °C) but ~85% RH with pressure. Used for biased (powered) components during testing.High-Pressure Aging Chambers
Designed for pressure + temperature exposure of materials like composites, coatings, or structural parts.
Common International Test Standards
| Standard | Description |
|---|---|
| JESD22-A110 / A118 | Moisture resistance and biased HAST testing for semiconductors |
| IEC 60068-2-66 | Environmental test method for unsaturated HAST |
| IEC 60749-4 | Semiconductor device reliability under humid conditions |
| EIAJ ED-4701 | Japan’s HAST test standard for electronic components |
| MIL-STD-202G | US military component testing, including PCT/HAST |
Industries & Products Tested
Electronics & Semiconductors: ICs, MOSFETs, MEMS, BGA packages
Automotive Electronics: sensors, ECU components, modules
Aerospace Materials: pressure-tested structural and composite materials
Photovoltaics & Energy: encapsulated solar modules and power electronics
Why Use HAST Chambers?
Reduces test time from 1000+ hours (THB) to under 96 hours
Exposes corrosion, delamination, and insulation defects quickly
Used in biased and unbiased reliability programs
Contact Us
Looking for a HAST or pressure aging solution? Get in touch:
Email: marketing@aslitesting.com
Global: https://www.aslitesting.com
Russia: https://aslitesting.ru
Explore the differences between saturated and unsaturated HAST chambers, key standards, applications, and how they accelerate reliability testing.
