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Photovoltaics Test Equipment

Photovoltaics Test Equipment

Electronics & Semiconductor Reliability Equipment

Engineered specifically for Semiconductor Packaging, ICs, PCBs/PCBAs, Automotive Electronics, and Power Modules. Qualify components strictly against JEDEC JESD22, AEC-Q100/Q200, MIL-STD-883, and IEC standards with CNAS-calibrated precise testing data.

CE Certified ISO 9001 System ISO 17025 (CNAS) Traceable Semiconductor Grade
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±0.5°C

Temperature Accuracy

≤10s

Thermal Shock Transfer

100%

CNAS Calibration Traceable

3000 Hz

Max Vibration Frequency

Key Application Fields

Delivering specialized environmental stress screening and qualification chambers tailored to critical electronics market segments.

Automotive Electronics

Designed for thermal shock, vibration, and humidity stress validation compliant with AEC-Q100 / AEC-Q200 standards.

Semiconductor & IC Packaging

HAST, PCT, and High-Temperature Storage (HTSL) chambers for microelectronics moisture sensitivity testing.

Aerospace & Defense

Extreme thermal shock and combined environmental systems built for rigorous MIL-STD-883 & MIL-STD-810 screening.

5G & Consumer Electronics

Corrosion, dust, and waterproof test chambers for sensors, RF modules, connectors, and portable smart devices.

Specialized Test Systems

Explore our specialized testing equipment engineered for electronic stress profiling and reliability verification.

Temperature & Humidity Chambers

JEDEC JESD22-A101 · IEC 60068

Precise temp/humidity control (-70°C ~ +180°C, 10%~98% RH) designed for IC reliability and PCB damp heat exposure testing.

Key Spec: Precision ±0.5°C / ±2.5% RH
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Thermal Shock Chambers

JEDEC JESD22-A104 · MIL-STD-883

Basket transfer time ≤10 seconds. Accelerate thermal expansion stress failure detection in solder joints and microchips.

Key Spec: -65°C to +150°C in seconds
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HAST / PCT Test Chambers

JEDEC JESD22-A118 · JESD22-A102

Accelerated moisture resistance testing for non-hermetic packaged ICs using saturated/unsaturated steam control.

Key Spec: Temp up to 142.9°C / 0.2 MPa
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Electromagnetic Vibration Systems

IEC 60068-2-6 · MIL-STD-810

Simulate dynamic mechanical stress from transit and operation profiles for automotive electronics and PCB assemblies.

Key Spec: Frequency DC-3000 Hz
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Industrial Precision Aging Ovens

JESD22-A103 · High Temp Storage

High-temperature baking and thermal storage chambers designed for semiconductor wafer curing and IC burn-in testing.

Key Spec: Max +300°C / Nitrogen Purge
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Salt Spray Corrosion Chambers

ISO 9227 · IEC 60068-2-11

Evaluates rust resistance and corrosion protection for metallic coatings, electronic components, and automotive hardware.

Key Spec: NSS / AASS / CASS Atomization
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International Test Standards Supported

Guaranteed data accuracy ensuring seamless supplier audits from automotive Tier-1s and global tech OEMs.

JEDEC JESD22
AEC-Q100 / Q200
MIL-STD-883
IEC 60068 Series
ISO 16750
IPC-TM-650

Providing high-precision environmental test chambers and CNAS-calibrated solutions for global semiconductor and electronics leaders.